(주)다나기술

Semiconductor test systems - 신뢰성 시험장비

The systems increase measurement quality & throughput
while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.

HTRB Test System
HTGB Test System
H3TRB Test System

• Fewer climate chambers due to high number of DUTs tested simultaneously
• No test interruptions due to defective DUTs
• High throughput for each system
• Several different tests possible within one test run
• Complete logging of all devices under test during the complete test phase
• Fully automated test process
• Automated test continuation according to characterization
• Freely programmable test system based on National Instruments' COTS platform
• Integrated safety system

IOL Test Systems - 신뢰성 시험장비

The IOL & Power-Cycling systems incread measurement quality & throughput
while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.
We focus on compplete monitoring and precise specification of all parameter
for each device under test.

• 100% monitoring of devices under test
• High throughput due to compact design and active cooling
• Fully automated test procedure
• Automated test continuation according to characterization
• Modular design allows for easy expansion
• Freely programmable test system based on National Instruments' COTS platform
• High-precision timing via FPGA technology
• Adaptable for various purposes and number of devices under test

HTOL test systems - 신뢰성 시험장비

Our IOL & Power-Cycling systems increase measurement quality &
throughput while simultaneously reducing the Total Cost of Test(TCoT)
of an open platform. We focus on complete monitoring and precise
temperature control for each device under test.

• Complete logging of all devices under test during the complete test phase
• Exact temperature control of each test object on its semiconductor structure
• RF load of the samples possible
• High throughput for each system
• Fully automated test procedure
• Automated test continuation according to characterization
• Freely programmable test system based on National Instruments' COTS platform
• No test interruptions due to defective DUTs
• Integrated safety system

HIL & Functional Test Systems

> From ARINC to ZigBee-with PXI and cRIO

We offer solutions for more than 2000 types of signals

> The superme discipline - signal conditioning

Our standardized plattforms with more than 130 modules provide a path for evey signal

> Active Breakout Panel-aBOP

Our modular aBOP uses a signal martrix,and allow every system to test itself and simulate faults

> Software-our solution's brain and face

Based on National Instrument's tools and our reliable
and tested libraries, our architects customize every system to your needs.

> Power Control Unit with intergrate saftey feature

Our modular DDU supplies your system and protects the operator